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Method of fabricating power MOSFET

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专利名称:Method of fabricating power MOSFET发明人:Chu-Kuang Liu申请号:US15210881申请日:20160714公开号:US09653560B1公开日:20170516

专利附图:

摘要:A method of fabricating a power metal oxide semiconductor field effecttransistor (MOSFET) is provided, and the method includes forming a semiconductor layeron a substrate, forming at least one first trench in the semiconductor layer, forming athermal oxide layer on a surface of the trench, forming a first gate in the first trench,

forming a chemical vapor deposition (CVD) oxide layer on the first gate in the first trench,forming a mask layer on the CVD oxide layer in the first trench so as to form a secondtrench between the mask layer and the thermal oxide layer, and forming a second gate inthe second trench.

申请人:Excelliance MOS Corporation

地址:Hsinchu County TW

国籍:TW

代理机构:Jianq Chyun IP Office

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